68320 Scanned Probe and Electron Microscopy
6cp; 6hpwRequisite(s): (33190 Mathematical Modelling for Science AND (68201 Physics in Action OR 68037 Physical Modelling OR 65201 Ver 4 Chemistry 2C))
Characterisation and production of materials, devices, biological systems with nanoscale features requires analysis and manipulation tools with extreme precision. This is a central issue in nanotechnology and many contemporary areas of materials science. The advent of techniques such as scanning tunnelling or atomic force microscopy allows us to view and manipulate objects at this level. Electron microscopy has a more established history, but in more recent times has turned out to be an invaluable tool to the nanotechnologist. This is a hands-on subject that introduces the concepts behind these techniques, their use and application in many areas of science and technology. Recent developments in the techniques are introduced, and students have the opportunity to gain hands-on experience using a variety of scanning probe and electron microscopes.
Typical availability
Spring semester, City campus
Fee information
2009 contribution for post-2008 Commonwealth-supported students: $520.25
Note: Students who commenced prior to 1 January 2008 should consult the Student contribution charges for Commonwealth supported students
Not all students are eligible for Commonwealth Supported places.
2009 amount for undergraduate domestic fee-paying students: $2,575.00
Note: Fees for Postgraduate domestic fee-paying students and international students are charged according to the course they are enrolled in. Students should refer to the Annual Fees Schedule.
Subject EFTSL: 0.125Access conditions
Note: The requisite information presented in this subject description covers only academic requisites. Full details of all enforced rules, covering both academic and admission requisites, are available at Access conditions and My Student Admin.
